A DFT-Compatible In-Situ Timing Error Detection and Correction Structure Featuring Low Area and Test Overhead
发布时间:2023-02-10
发表刊物:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2022
是否译文:否
收录刊物:SCI
论文类型:期刊&会议论文