上海交大研究生院主页平台管理系统 Xingchen Ji--Home-- Measurements and Modeling of Atomic-Scale Sidewall Roughness and Losses in Integrated Photonic Devices

Language : 中文

Xingchen Ji

Scientific Research: Research Field; Paper Publications; Patents; Published Books; Research Projects

Teaching Research: Teaching Resources; Teaching Information; Teaching Achievement

Current position: Home > Scientific Research > Paper Publications

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Journal:Advanced Optical Materials

ISSN No.:2195-1071

Translation or Not:no

Date of Publication:2022-06-01

Indexed by:期刊论文

Date of Publication:2022-06-01

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