上海交大研究生院主页平台管理系统 Shenghong Ju--Home-- Investigation on interfacial thermal resistance and phonon scattering at twist boundary of silicon

Language : 中文

Shenghong Ju

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Journal:Journal of Applied Physics 113, 053513, 2013.

Translation or Not:no

Date of Publication:2013-02-01

Indexed by:期刊论文

Date of Publication:2013-02-01

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