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Fast Analytic Electromigration Analysis for General Multisegment Interconnect Wires

Date of Publication:2020-02-01 Hits:

Journal:IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
ISSN No.:1063-8210
Translation or Not:no
Date of Publication:2020-02-01
Indexed by:期刊论文

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Fast Analytic Electromigration Analysis for General Multisegment Interconnect Wires