Journal:International Journal of Systems Science ISSN No.:1464–5319 Translation or Not:no Date of Publication:2003-03-01 Indexed by:期刊论文
Pre One:Experiments and Comparisons of Power to Failure for SiGe-Based Low-Noise Amplifiers Under High-Power Microwave Pulses
Next One:Ruggedness Characterization of Bonding Wire Arrays in LDMOSFET-Based Power Amplifiers