上海交大研究生院主页平台管理系统 XU JIJIN--Home-- First principles calculation of the effects of solute atom on electromigration resistance of Al interconnects

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Journal: Journal of Physics D: Applied Physics

ISSN No.:0022-3727

Translation or Not:no

Date of Publication:2009-05-01

Indexed by:期刊论文

Date of Publication:2009-05-01

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