上海交大研究生院主页平台管理系统 Yan Hao--Home-- Impact of charge-coupled device size on axial measurement error in digital holographic system

Language : 中文

闫浩

Home

Scientific Research: Research Field; Paper Publications; Patents; Published Books; Research Projects

Teaching Research: Teaching Resources; Teaching Information; Teaching Achievement

Awards and Honours

Admission Information

Student Information

My Album

Blog

MOBILE Version

Paper Publications

Current position: Home > Scientific Research > Paper Publications

Impact of charge-coupled device size on axial measurement error in digital holographic system

Hits:

Journal:OPTICS LETTERS

ISSN No.:0146-9592

Translation or Not:no

Date of Publication:2013-04-01

Indexed by:期刊论文

Date of Publication:2013-04-01

Pre One:Binary Iron-Manganese Cocatalyst for Simultaneous Activation of C-C and C-O Bonds to Maximally Utilize Lignin for Syngas Generation over InGaN

Next One:双碳战略下绿色动力与数字技术融合驱动汽车产业高质量发展及其趋势展望

Recommend this Article

沪ICP备05052060 版权所有©上海交通大学

Click: