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Experimental Investigation and Electro-Thermal-Stress Modeling of GaAs and LDMOS FET Under Conductive Electromagnetic Pulse (EMP)

Date of Publication:2014-08-01 Hits:

Journal:General Assembly and Scientific Symposium (URSI GASS), 2014 XXXIth URSI
ISSN No.:0
Translation or Not:no
Date of Publication:2014-08-01
Indexed by:会议论文

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Experimental Investigation and Electro-Thermal-Stress Modeling of GaAs and LDMOS FET Under Conductive Electromagnetic Pulse (EMP)