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Immunity Analysis and Experimental Investigation of a Low Noise Amplifier using a Transient Voltage Suppressor Diode under Direct Current Injection of HPM Pulses

Date of Publication:2014-12-01 Hits:

Journal:IEEE Transactions on Electromagnetic Compatibility
ISSN No.:0018-9375
Translation or Not:no
Date of Publication:2014-12-01
Indexed by:期刊论文

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