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Electro-Thermal-Stress Analysis of A LDMOS FET Breakdown under High Power Microwave Pulses

Date of Publication:2013-10-01 Hits:

Journal:2013 8th European Microwave Integrated Circuits Conference, EuMIC 2013 - Held as Part of 16th European Microwave Week, EuMW 2013
ISSN No.:9782874870323
Translation or Not:no
Date of Publication:2013-10-01
Indexed by:会议论文

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