Personal Information

VIEW MORE
Home > Scientific Research > Paper Publications

Investigation on Failure Mechanisms of GaN HEMT Caused by High-Power Microwave (HPM) Pulses

Date of Publication:2017-06-01 Hits:

Journal:IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
ISSN No.:0018-9375
Translation or Not:no
Date of Publication:2017-06-01
Indexed by:期刊论文

Pre One:Tunable THz Multiband Frequency-Selective Surface Based on Hybrid Metal-Graphene Structure

Next One:Study on electro-thermo-mechanical responses of bonding wires arrays used for the package design of LDMOSFET-based RF Amplifier

Recommend this article

 沪ICP备05052060 版权所有©上海交通大学

Click:  | The Last Update Time:..