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超短光纤中布里渊散射高精度测量系统

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Patent Applicant:zouweiwen
Disigner of the Invention:zouweiwen
Type of Patent:国家发明专利
State of Patent:已授权
Application Number:2011102473364
Authorization number:2011102473364
Service Invention or Not:no
Application Date:2011-08-26
Publication Date:2014-04-10
Authorization Date:2014-04-10

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