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In Situ Error Detection Techniques in Ultralow Voltage Pipelines: Analysis and Optimizations

Date of Publication:2017-03-01 Hits:

Journal:IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
ISSN No.:1063-8210
Translation or Not:no
Date of Publication:2017-03-01
Indexed by:期刊论文

Pre One:A 0.33 V 2.5 mu W cross-point data-aware write structure, read-half-select disturb-free sub-threshold SRAM in 130 nm CMOS

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