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A DFT-Compatible In-Situ Timing Error Detection and Correction Structure Featuring Low Area and Test Overhead

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Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2022
Translation or Not:no
Included Journals:SCI
Indexed by:报刊论文

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A DFT-Compatible In-Situ Timing Error Detection and Correction Structure Featuring Low Area and Test Overhead