Personal Information

VIEW MORE
Home > Scientific Research > Paper Publications

Electro-Thermal-Stress Analysis of AlGaN/GaN HEMTs Breakdown under Intentional EMI

Date of Publication:2016-08-01 Hits:

Journal:2016 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT 2016)
ISSN No.:978-1-5090-1235-0/16
Translation or Not:no
Date of Publication:2016-08-01
Indexed by:会议论文

Pre One:Thermal-Mechanical Analysis of Packaged Power Amplifiers based on Heterogeneous Integrations using photosensitive BCB

Next One:Reconfigurable Graphene Reflectarray with Switchable Focus

Recommend this article

 沪ICP备05052060 版权所有©上海交通大学

Click:  | The Last Update Time:..