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Experiments and Comparisons of Power to Failure for SiGe-Based Low-Noise Amplifiers Under High-Power Microwave Pulses

Date of Publication:2018-10-01 Hits:

Journal:IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
ISSN No.:0018-9375
Translation or Not:no
Date of Publication:2018-10-01
Indexed by:期刊论文

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