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Electro-Thermal analysis of SiGe HBT under HPM Injection

Date of Publication:2020-12-01 Hits:

Journal:2020 IEEE MTT-S INTERNATIONAL CONFERENCE ON NUMERICAL ELECTROMAGNETIC AND MULTIPHYSICS MODELING AND OPTIMIZATION (NEMO 2020)
ISSN No.:978-1-7281-6966-8
Translation or Not:no
Date of Publication:2020-12-01
Indexed by:会议论文

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