Personal Information

VIEW MORE
Home > Scientific Research > Paper Publications

Design, Fabrication and Measurement of TaN Thin Film Resistor Based on MEMS Technology

Date of Publication:2020-09-01 Hits:

Journal:2020 International Conference on Microwave and Millimeter Wave Technology, ICMMT 2020 - Proceedings
ISSN No.:9781728157337
Translation or Not:no
Date of Publication:2020-09-01
Indexed by:会议论文

Pre One:Design and Fabrication of W band Heterogeneous Integrated Transceivers

Next One:Electro-Thermal analysis of SiGe HBT under HPM Injection

Recommend this article

 沪ICP备05052060 版权所有©上海交通大学

Click:  | The Last Update Time:..