上海交大研究生院主页平台管理系统周亮--中文主页-- Experimental Investigation and Electro-Thermal-Stress Modeling of GaAs and LDMOS FET Under Conductive Electromagnetic Pulse (EMP)

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Experimental Investigation and Electro-Thermal-Stress Modeling of GaAs and LDMOS FET Under Conductive Electromagnetic Pulse (EMP)

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