上海交大研究生院主页平台管理系统周亮--中文主页-- Electro-Thermal-Stress Analysis of A LDMOS FET Breakdown under High Power Microwave Pulses

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Electro-Thermal-Stress Analysis of A LDMOS FET Breakdown under High Power Microwave Pulses

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发表刊物：2013 8th European Microwave Integrated Circuits Conference, EuMIC 2013 - Held as Part of 16th European Microwave Week, EuMW 2013
ISSN号：9782874870323
是否译文：否
发表时间：2013-10-01
论文类型：会议论文
发表时间：2013-10-01

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