上海交大研究生院主页平台管理系统 renpengpeng--Home-- Investigation of Time Dependent Dielectric Breakdown (TDDB) of Hf0.5Zr0.5O2-Based Ferroelectrics Under Both Forward and Reverse Stress Conditions

Language : 中文

任鹏鹏

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Journal:IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY

ISSN No.:2168-6734

Translation or Not:no

Date of Publication:2021-08-01

Indexed by:期刊论文

Date of Publication:2021-08-01

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