上海交大研究生院主页平台管理系统 renpengpeng--Home-- Pitfalls for the characterization of self-heating effect in nano-scaled devices

Language : 中文

任鹏鹏

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Journal:International Symposium on the Physical and Failure Analysis of Integrated Circuits(IPFA), 2021

Translation or Not:no

Date of Publication:2021-09-01

Indexed by:会议论文

Date of Publication:2021-09-01

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