上海交大研究生院主页平台管理系统任鹏鹏--中文主页-- Investigation of Time Dependent Dielectric Breakdown (TDDB) of Hf0.5Zr0.5O2-Based Ferroelectrics Under Both Forward and Reverse Stress Conditions

论文成果

中文主页 - 科学研究 - 论文成果

Investigation of Time Dependent Dielectric Breakdown (TDDB) of Hf0.5Zr0.5O2-Based Ferroelectrics Under Both Forward and Reverse Stress Conditions

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发表刊物：IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY

ISSN号：2168-6734

是否译文：否

发表时间：2021-08-01

论文类型：期刊论文

合写作者：任鹏鹏

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