上海交大研究生院主页平台管理系统任鹏鹏--中文主页-- Pitfalls for the characterization of self-heating effect in nano-scaled devices

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Pitfalls for the characterization of self-heating effect in nano-scaled devices

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发表刊物：International Symposium on the Physical and Failure Analysis of Integrated Circuits(IPFA), 2021

是否译文：否

发表时间：2021-09-01

论文类型：会议论文

合写作者：任鹏鹏

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